The number of substrates processed for one sputtering cycle, double-sided |
96 pcs. ∅100 176 pcs.60x48 |
Automatic shutter control for all targets |
|
Working gas consumption for each channel, l/hour |
0÷9 |
The number of working gases (non-aggressive) |
up to 3 |
Ion cleaning module |
1 |
Magnetron units |
up to 4 |
Magnetron type (for film deposition) |
mid-frenquency pulsed |
Magnetron working current, controlled, A |
0,5÷15 (30-optional) |
Magnetron voltage, V |
up to 650 |
Targets dimensions (indirectly cooled complex targets can be used), mm |
749x100x6÷15 |
Allowed pressure in sputtering chamber, Pa |
0,07÷0,3 |
Bias generator power, kVA |
4 |
Bias sputtering on the cooled substrate (pulsing frequency 100 kHz) |
Optional |
The witness piece of substrate resistance range, kn |
0,2÷20 |
Resistivity measurement uncertainty,% |
±1 |
Substrates temperature Instability, % |
±5 |
Recommended temperature of substrates (°C, max 700) |
50÷250 (350 optional) |
Limiting residual pressure in working chamber, Pa |
8x10-4 |
Total system start-up time including cryopump warm-up, min |
< 120 |
Overall dimensions of the system, with lifted chamber (width x depth x height), mm |
1450x1660x3130 |
Total weight, including power and control units, kg |
<1850 |