Study of electrostatic, magnetic and thermal fields on the surface of solids
Company:
Science and Technology Center of Nano and Microsystems Engineering of MIET Contact name: Maxim Mahiboroda
Email: m.makhiboroda@gmail.com
Phone: + (499) 720-69-07
Website: https://miet.ru/structure/s/1526/e/36316/308
Key limit /boundary/ process parameters:
- Minimum scan size: 500 × 500 nm.
- Maximum scan size: 100 × 100 µm
- Maximum size of sample: 4 × 4 × 2 cm
Equipment:
Atomic microscope SmartSPM, AIST-NT
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