Measurement of optical properties and thicknesses of the dielectric and is optically transparent samples including the metal thin film 50 nm thick
Company:
Science and Technology Center of Nano and Microsystems Engineering of MIET Contact name: Maxim Mahiboroda
Email: m.makhiboroda@gmail.com
Phone: +7 (499) 720-69-07
Website: https://miet.ru/structure/s/1526/e/36316/308
Key limit /boundary/ process parameters:
Measurement of optical properties and thickness of the dielectric and optically transparent samples in the wavelength range from 442 nm to 848 nm/
Equipment:
Simple Thin Film Measurement Tool Auto Se System, HORIBA Jobin Yvon
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