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Measurement of optical properties and thicknesses of the dielectric and is optically transparent samples including the metal thin film 50 nm thick

 Measurement of optical properties and thicknesses of the dielectric and is optically transparent samples including the metal thin film 50 nm thick Company: Science and Technology Center of Nano and Microsystems Engineering of MIET
Contact name: Maxim Mahiboroda
Email: m.makhiboroda@gmail.com
Phone: +7 (499) 720-69-07
Website: https://miet.ru/structure/s/1526/e/36316/308

Key limit /boundary/ process parameters:

Measurement of optical properties and thickness of the dielectric and optically transparent samples in the wavelength range from 442 nm to 848 nm/

Equipment:

Simple Thin Film Measurement Tool Auto Se System, HORIBA Jobin Yvon

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