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A comprehensive analysis of the structure of integrated circuits

A comprehensive analysis of the structure of integrated circuits Company: Center "Diagnosis and modification of microstructures and nanostructures" MIET
Contact name: Kukin Vladimir
Email: kukin@miee.ru
Phone: +7 (499) 720-87-65
Website: www.miee.ru

Key limit /boundary/ process parameters:

  • automated local opening plastic cases of integrated circuits using chemical etching;
  • etching plasma reactive gases, can remove passivirushie and insulating layers in the analysis of the topology and structure of integrated circuits;
  • research, monitoring and photographing models of articles micro- and nanoelectronics, including silicon wafers with a diameter up to 200 mm

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